SDL Mailing List Archive: SDL-News: Call for Paper: Model Based

Subject: SDL-News: Call for Paper: Model Based Testing and Engineering
From: Barath Kumar (barath.kumar#hs-owl.de)
Date: Tue Sep 06 2011 - 13:14:18 GMT

The purpose of this special session is to bring industry and academia under
one roof serving as a forum for discussion and exchange of ideas in the
context of using Model based testing and engineering in the industrial
sector. This special section might also serve as a window for collaboration
(e.g. future projects) between the Model-Based testing community and
industries like software testing, automation, automotive, telecommunication,
etc. promoting MBT’s further usage.

Topics of interest include (but are not limited to):
-----------------------------------------------------

a)Model based test design and specifications
b)Model based testing and TTCN-3
c)Model based software development for embedded systems
d)Model driven system/protocol engineering
e)Modeling methodologies for testing
f)Model based test generation techniques for Industrial systems (Complex
systems)
g)Model based diagnosis
h)Hardware-in-the-Loop testing (automation and automotive)
i)Tool automation/simulation and tool support
j)Experience reports on using Model Based Testing

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SUBMISSION PROCEDURE

Same as for regular papers. All the instructions for paper submission are
included in the conference website: www.isi.gr/icit12

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(Our apologies if you receive multiple copies of this Call-for-Papers)

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CALL FOR PAPERS: Model Based Testing and Engineering (Special Session)

2012 IEEE International Conference on Industrial Technology (ICIT 2012)

Kos Island, Greece, March 19 - 21, 2012

Special section CFP: http://www.hs-owl.de/fb5/labor/ne/pdf/ICIT_CfP_SS4.pdf

=========================================================================

Important dates:

Deadline for submission of full paper: 15th September 2011

Notification of acceptance: 15th November 2011

Deadline for final manuscript: 10th December 2011

=========================================================================

Scope:
------

In a rapidly changing Industrial technology era, higher product quality and faster time to market are key driving forces to success. Increased use of complex industrial software has increased the need for better testing methodologies. Fueled by this need, Model based engineering and testing (MDD & MBT) have evolved as suitable candidates over the last decade to face this challenge, which is evident from MBT&##8217;s substantial usage in the field of aerospace, automotive, telecommunication and micro-electronics.

The purpose of this special session is to bring industry and academia under one roof serving as a forum for discussion and exchange of ideas in the context of using Model based testing and engineering in the industrial sector. This special section might also serve as a window for collaboration (e.g. future projects) between the Model-Based testing community and industries like software testing, automation, automotive, telecommunication, etc. promoting MBT&##8217;s further usage.

Topics of interest include (but are not limited to):
-----------------------------------------------------

a)Model based test design and specifications
b)Model based testing and TTCN-3
c)Model based software development for embedded systems
d)Model driven system/protocol engineering
e)Modeling methodologies for testing
f)Model based test generation techniques for Industrial systems (Complex systems)
g)Model based diagnosis
h)Hardware-in-the-Loop testing (automation and automotive)
i)Tool automation/simulation and tool support
j)Experience reports on using Model Based Testing

Review Committee members:

--------------------------

Paul Ammann (George Mason University, USA)

Paul Baker (Motorola, UK)

Christof Budnik (Siemens, USA)

Mirko Conrad (Mathworks, USA)

Steve Counsell (Brunel University, UK)

Tibor Csöndes (Ericsson, Hungary)

Streitferdt Detlef (Technische Universitaet Ilmenau, Germany)

Robert Eschbach (Fraunhofer IESE, Germany)

Zhen Ru Dai (University of Applied Science Hamburg, Germany)

Robert Hierons (Brunel University, UK)

Juergen Jasperneite (Fraunhofer IOSB- INA, Germany)

Ulrich Jumar (ifak &##8211; Institute f. Automation u. Kommunikation e.V., Germany)

Victor Kuliamin (Institute for System Programming, Russia)

Barath Kumar (Institut Industrial IT, Germany)

Lan Lin (University of Tennessee, USA)

Brian Nielsen (Aalborg University, Denmark)

Alexander Pretschner (Karlsruhe Institute of Technology, Germany)

Virginia Papailiopoulou (INRIA, France)

Ina Schieferdecker (Fraunhofer FOKUS, Germany)

Alin Stefanescu (University of Pitesti, Romania)

Dragos Truscan (Åbo Akademi University, Finland)

Theofanis Vassiliou-Gioles (Testing Technologies, Germany)

Stefan Wagner (Institute of Software Technology, Germany)

Stephan Weißleder (Fraunhofer FIRST, Germany)

Sebastian Wieczorek (SAP, Germany)

Justyna Zander (Fraunhofer FOKUS, Germany)

-----------------------------------------------------------------------------------------------------------------------
SUBMISSION PROCEDURE

Same as for regular papers. All the instructions for paper submission are included in the conference website: www.isi.gr/icit12

Special section CFP: http://www.hs-owl.de/fb5/labor/ne/pdf/ICIT_CfP_SS4.pdf

-----------------------------------------------------------------------------------------------------------------------

________________________________________________________

Cheers and regards

'Model Based Testing and Engineering' session organisation committee.

http://www.iosb.fraunhofer.de/servlet/is/2269/

http://www.hs-owl.de/init/

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